A new hierarchical approach to test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing
    Place of PublicationDalfsen
    Pages163-172
    Number of pages0
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112965

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