A New Monitor Insertion Algorithm for Intermittent Fault Detection

Hassan Ebrahimi, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)


The dependability of highly dependable systems relies on the reliability of its components and interconnections. One of the most challenging faults that threatens the reliability of interconnections in a system are intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the chip level has been tackled by utilising a fully digital insitu IRF monitor. This paper introduces a new algorithm for inserting IRF monitors in a design. The goal of this algorithm is to minimise the number of IRF monitors while providing a high fault coverage for IRFs. The algorithm has been validated using software-based fault injection. The simulation results show that the proposed algorithm improves the IRF coverage at the chip level at the cost of a small area and power-consumption overhead.

Original languageEnglish
Title of host publication2020 IEEE European Test Symposium, ETS 2020
ISBN (Electronic)9781728143125
Publication statusPublished - May 2020
Event25th IEEE European Test Symposium, ETS 2020 - Virtual Event, Tallinn, Estonia
Duration: 25 May 202029 May 2020
Conference number: 25

Publication series

NameProceedings of the European Test Workshop
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780


Conference25th IEEE European Test Symposium, ETS 2020
Abbreviated titleETS 2020


  • Chip-level and board-level fault detection
  • Intermittent Fault Detection
  • Intermittent Resistive Faults
  • No Faults Found
  • Reliability
  • n/a OA procedure


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