A New Monitor Insertion Algorithm for Intermittent Fault Detection

Hassan Ebrahimi; Hans G. Kerkhoff

doi:10.1109/ETS48528.2020.9131563

A New Monitor Insertion Algorithm for Intermittent Fault Detection

Hassan Ebrahimi
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

29 Downloads (Pure)

Abstract

The dependability of highly dependable systems relies on the reliability of its components and interconnections. One of the most challenging faults that threatens the reliability of interconnections in a system are intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the chip level has been tackled by utilising a fully digital insitu IRF monitor. This paper introduces a new algorithm for inserting IRF monitors in a design. The goal of this algorithm is to minimise the number of IRF monitors while providing a high fault coverage for IRFs. The algorithm has been validated using software-based fault injection. The simulation results show that the proposed algorithm improves the IRF coverage at the chip level at the cost of a small area and power-consumption overhead.

Original language	English
Title of host publication	2020 IEEE European Test Symposium, ETS 2020
Publisher	IEEE
ISBN (Electronic)	9781728143125
DOIs	https://doi.org/10.1109/ETS48528.2020.9131563
Publication status	Published - May 2020
Event	25th IEEE European Test Symposium, ETS 2020 - Virtual Event, Tallinn, Estonia Duration: 25 May 2020 → 29 May 2020 Conference number: 25

Publication series

Name	Proceedings of the European Test Workshop
Volume	2020-May
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	25th IEEE European Test Symposium, ETS 2020
Abbreviated title	ETS 2020
Country/Territory	Estonia
City	Tallinn
Period	25/05/20 → 29/05/20

Keywords

Chip-level and board-level fault detection
Intermittent Fault Detection
Intermittent Resistive Faults
No Faults Found
Reliability
n/a OA procedure

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10.1109/ETS48528.2020.9131563

Cite this

@inproceedings{cb8ae07f94ca4209a9a1782b9f161cd0,

title = "A New Monitor Insertion Algorithm for Intermittent Fault Detection",

abstract = "The dependability of highly dependable systems relies on the reliability of its components and interconnections. One of the most challenging faults that threatens the reliability of interconnections in a system are intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the chip level has been tackled by utilising a fully digital insitu IRF monitor. This paper introduces a new algorithm for inserting IRF monitors in a design. The goal of this algorithm is to minimise the number of IRF monitors while providing a high fault coverage for IRFs. The algorithm has been validated using software-based fault injection. The simulation results show that the proposed algorithm improves the IRF coverage at the chip level at the cost of a small area and power-consumption overhead.",

keywords = "Chip-level and board-level fault detection, Intermittent Fault Detection, Intermittent Resistive Faults, No Faults Found, Reliability, n/a OA procedure",

author = "Hassan Ebrahimi and Kerkhoff, \{Hans G.\}",

note = "Funding Information: ACKNOWLEDGEMENT This research was carried out within the EU-PENTA project ”HADES”, financed by the European Commission (EC) and the Netherlands Enterprise Agency (RVO). Publisher Copyright: {\textcopyright} 2020 IEEE.; 25th IEEE European Test Symposium, ETS 2020, ETS 2020 ; Conference date: 25-05-2020 Through 29-05-2020",

year = "2020",

month = may,

doi = "10.1109/ETS48528.2020.9131563",

language = "English",

series = "Proceedings of the European Test Workshop",

publisher = "IEEE",

booktitle = "2020 IEEE European Test Symposium, ETS 2020",

address = "United States",

}

TY - GEN

T1 - A New Monitor Insertion Algorithm for Intermittent Fault Detection

AU - Ebrahimi, Hassan

AU - Kerkhoff, Hans G.

N1 - Conference code: 25

PY - 2020/5

Y1 - 2020/5

N2 - The dependability of highly dependable systems relies on the reliability of its components and interconnections. One of the most challenging faults that threatens the reliability of interconnections in a system are intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the chip level has been tackled by utilising a fully digital insitu IRF monitor. This paper introduces a new algorithm for inserting IRF monitors in a design. The goal of this algorithm is to minimise the number of IRF monitors while providing a high fault coverage for IRFs. The algorithm has been validated using software-based fault injection. The simulation results show that the proposed algorithm improves the IRF coverage at the chip level at the cost of a small area and power-consumption overhead.

AB - The dependability of highly dependable systems relies on the reliability of its components and interconnections. One of the most challenging faults that threatens the reliability of interconnections in a system are intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the chip level has been tackled by utilising a fully digital insitu IRF monitor. This paper introduces a new algorithm for inserting IRF monitors in a design. The goal of this algorithm is to minimise the number of IRF monitors while providing a high fault coverage for IRFs. The algorithm has been validated using software-based fault injection. The simulation results show that the proposed algorithm improves the IRF coverage at the chip level at the cost of a small area and power-consumption overhead.

KW - Chip-level and board-level fault detection

KW - Intermittent Fault Detection

KW - Intermittent Resistive Faults

KW - No Faults Found

KW - Reliability

KW - n/a OA procedure

UR - https://www.scopus.com/pages/publications/85089142382

U2 - 10.1109/ETS48528.2020.9131563

DO - 10.1109/ETS48528.2020.9131563

M3 - Conference contribution

AN - SCOPUS:85089142382

T3 - Proceedings of the European Test Workshop

BT - 2020 IEEE European Test Symposium, ETS 2020

PB - IEEE

T2 - 25th IEEE European Test Symposium, ETS 2020

Y2 - 25 May 2020 through 29 May 2020

ER -

A New Monitor Insertion Algorithm for Intermittent Fault Detection

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Keywords

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