This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.
|Number of pages
|Published - 2003
|3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003 - Southhampton, United Kingdom
Duration: 2 Apr 2003 → 3 Apr 2003
Conference number: 3
|3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003
|2/04/03 → 3/04/03