A probabilistic coverage for on-the-fly test generation algorithms

N. Goga

A probabilistic coverage for on-the-fly test generation algorithms

N. Goga

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Abstract

This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.

Original language	English
Number of pages	16
Publication status	Published - 2003
Event	3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003 - Southhampton, United Kingdom Duration: 2 Apr 2003 → 3 Apr 2003 Conference number: 3 http://users.ecs.soton.ac.uk/mal/avocs03/

Workshop

Workshop	3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003
Abbreviated title	AVoCS
Country/Territory	United Kingdom
City	Southhampton
Period	2/04/03 → 3/04/03
Internet address	http://users.ecs.soton.ac.uk/mal/avocs03/

Keywords

FMT-TESTING
IR-63328
EWI-6535

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Probabilistic CoverageFinal published version, 168 KB

http://users.ecs.soton.ac.uk/mal/avocs03/proceedings/10.ps

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title = "A probabilistic coverage for on-the-fly test generation algorithms",

abstract = "This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.",

keywords = "FMT-TESTING, IR-63328, EWI-6535",

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N2 - This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.

AB - This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.

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KW - IR-63328

KW - EWI-6535

M3 - Paper

T2 - 3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003

Y2 - 2 April 2003 through 3 April 2003

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A probabilistic coverage for on-the-fly test generation algorithms

Abstract

Workshop

Keywords

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Cite this