A probabilistic coverage for on-the-fly test generation algorithms

N. Goga

    Research output: Contribution to conferencePaperAcademicpeer-review

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    Abstract

    This paper describes a way to compute the coverage for an on-the-fly test generation algorithm based on a probabilistic approach. The on-the-fly test generation and execution process and the development process of an implementation from a specification are viewed as a stochastic process. The probabilities of the stochastic processes are integrated in a generalized definition of coverage. The generalized formulas are instantiated for the ioco theory and for the specification of the TorX test generation algorithm.
    Original languageEnglish
    Number of pages16
    Publication statusPublished - 2003
    Event3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003 - Southhampton, United Kingdom
    Duration: 2 Apr 20033 Apr 2003
    Conference number: 3
    http://users.ecs.soton.ac.uk/mal/avocs03/

    Workshop

    Workshop3rd Workshop on Automated Verification of Critical Systems, AVoCS 2003
    Abbreviated titleAVoCS
    CountryUnited Kingdom
    CitySouthhampton
    Period2/04/033/04/03
    Internet address

    Keywords

    • FMT-TESTING
    • IR-63328
    • EWI-6535

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