A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.
|Publication status||Published - 1989|
|Event||2nd International Conference on Microelectronic Test Structures, ICMTS 1989 - Edinburgh, United Kingdom|
Duration: 13 Mar 1989 → 14 Mar 1989
Conference number: 2
|Conference||2nd International Conference on Microelectronic Test Structures, ICMTS 1989|
|Period||13/03/89 → 14/03/89|