A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

K. Lippe, Hans G. Kerkhoff, G. Kloppers, N. Morskieft

Research output: Contribution to conferencePaperAcademic

2 Citations (Scopus)
148 Downloads (Pure)

Abstract

A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.
Original languageUndefined
Pages225-226
DOIs
Publication statusPublished - 1989
Event2nd International Conference on Microelectronic Test Structures, ICMTS 1989 - Edinburgh, United Kingdom
Duration: 13 Mar 198914 Mar 1989
Conference number: 2

Conference

Conference2nd International Conference on Microelectronic Test Structures, ICMTS 1989
Abbreviated titleICMTS
CountryUnited Kingdom
CityEdinburgh
Period13/03/8914/03/89

Keywords

  • IR-56088

Cite this

Lippe, K., Kerkhoff, H. G., Kloppers, G., & Morskieft, N. (1989). A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. 225-226. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom. https://doi.org/10.1109/ICMTS.1989.39313
Lippe, K. ; Kerkhoff, Hans G. ; Kloppers, G. ; Morskieft, N. / A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom.
@conference{78e1368e7a2f43198a6667f459c18257,
title = "A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements",
abstract = "A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.",
keywords = "IR-56088",
author = "K. Lippe and Kerkhoff, {Hans G.} and G. Kloppers and N. Morskieft",
year = "1989",
doi = "10.1109/ICMTS.1989.39313",
language = "Undefined",
pages = "225--226",
note = "null ; Conference date: 13-03-1989 Through 14-03-1989",

}

Lippe, K, Kerkhoff, HG, Kloppers, G & Morskieft, N 1989, 'A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements' Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom, 13/03/89 - 14/03/89, pp. 225-226. https://doi.org/10.1109/ICMTS.1989.39313

A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. / Lippe, K.; Kerkhoff, Hans G.; Kloppers, G.; Morskieft, N.

1989. 225-226 Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom.

Research output: Contribution to conferencePaperAcademic

TY - CONF

T1 - A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

AU - Lippe, K.

AU - Kerkhoff, Hans G.

AU - Kloppers, G.

AU - Morskieft, N.

PY - 1989

Y1 - 1989

N2 - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

AB - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

KW - IR-56088

U2 - 10.1109/ICMTS.1989.39313

DO - 10.1109/ICMTS.1989.39313

M3 - Paper

SP - 225

EP - 226

ER -

Lippe K, Kerkhoff HG, Kloppers G, Morskieft N. A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. 1989. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom. https://doi.org/10.1109/ICMTS.1989.39313