A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

K. Lippe, Hans G. Kerkhoff, G. Kloppers, N. Morskieft

    Research output: Contribution to conferencePaperAcademic

    2 Citations (Scopus)
    300 Downloads (Pure)

    Abstract

    A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.
    Original languageEnglish
    Pages225-226
    DOIs
    Publication statusPublished - 1989
    Event2nd International Conference on Microelectronic Test Structures, ICMTS 1989 - Edinburgh, United Kingdom
    Duration: 13 Mar 198914 Mar 1989
    Conference number: 2

    Conference

    Conference2nd International Conference on Microelectronic Test Structures, ICMTS 1989
    Abbreviated titleICMTS
    CountryUnited Kingdom
    CityEdinburgh
    Period13/03/8914/03/89

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