A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

K. Lippe, Hans G. Kerkhoff, G. Kloppers, N. Morskieft

    Research output: Contribution to conferencePaper

    2 Citations (Scopus)
    193 Downloads (Pure)

    Abstract

    A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.
    Original languageUndefined
    Pages225-226
    DOIs
    Publication statusPublished - 1989
    Event2nd International Conference on Microelectronic Test Structures, ICMTS 1989 - Edinburgh, United Kingdom
    Duration: 13 Mar 198914 Mar 1989
    Conference number: 2

    Conference

    Conference2nd International Conference on Microelectronic Test Structures, ICMTS 1989
    Abbreviated titleICMTS
    CountryUnited Kingdom
    CityEdinburgh
    Period13/03/8914/03/89

    Keywords

    • IR-56088

    Cite this

    Lippe, K., Kerkhoff, H. G., Kloppers, G., & Morskieft, N. (1989). A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. 225-226. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom. https://doi.org/10.1109/ICMTS.1989.39313
    Lippe, K. ; Kerkhoff, Hans G. ; Kloppers, G. ; Morskieft, N. / A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom.
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    abstract = "A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.",
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    Lippe, K, Kerkhoff, HG, Kloppers, G & Morskieft, N 1989, 'A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements' Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom, 13/03/89 - 14/03/89, pp. 225-226. https://doi.org/10.1109/ICMTS.1989.39313

    A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. / Lippe, K.; Kerkhoff, Hans G.; Kloppers, G.; Morskieft, N.

    1989. 225-226 Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom.

    Research output: Contribution to conferencePaper

    TY - CONF

    T1 - A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

    AU - Lippe, K.

    AU - Kerkhoff, Hans G.

    AU - Kloppers, G.

    AU - Morskieft, N.

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    N2 - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

    AB - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

    KW - IR-56088

    U2 - 10.1109/ICMTS.1989.39313

    DO - 10.1109/ICMTS.1989.39313

    M3 - Paper

    SP - 225

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    Lippe K, Kerkhoff HG, Kloppers G, Morskieft N. A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements. 1989. Paper presented at 2nd International Conference on Microelectronic Test Structures, ICMTS 1989, Edinburgh, United Kingdom. https://doi.org/10.1109/ICMTS.1989.39313