A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

K. Lippe; Hans G. Kerkhoff; G. Kloppers; N. Morskieft

doi:10.1109/ICMTS.1989.39313

A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

K. Lippe, Hans G. Kerkhoff, G. Kloppers, N. Morskieft

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Abstract

A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

Original language	English
Pages	225-226
DOIs	https://doi.org/10.1109/ICMTS.1989.39313
Publication status	Published - 1989
Event	2nd International Conference on Microelectronic Test Structures, ICMTS 1989 - Edinburgh, United Kingdom Duration: 13 Mar 1989 → 14 Mar 1989 Conference number: 2

Conference

Conference	2nd International Conference on Microelectronic Test Structures, ICMTS 1989
Abbreviated title	ICMTS
Country/Territory	United Kingdom
City	Edinburgh
Period	13/03/89 → 14/03/89

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10.1109/ICMTS.1989.39313

Lippe1989programmableFinal published version, 155 KB

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title = "A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements",

abstract = "A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.",

author = "K. Lippe and Kerkhoff, {Hans G.} and G. Kloppers and N. Morskieft",

year = "1989",

doi = "10.1109/ICMTS.1989.39313",

language = "English",

pages = "225--226",

note = "2nd International Conference on Microelectronic Test Structures, ICMTS 1989, ICMTS ; Conference date: 13-03-1989 Through 14-03-1989",

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T1 - A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

AU - Lippe, K.

AU - Kerkhoff, Hans G.

AU - Kloppers, G.

AU - Morskieft, N.

N1 - Conference code: 2

PY - 1989

Y1 - 1989

N2 - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

AB - A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

U2 - 10.1109/ICMTS.1989.39313

DO - 10.1109/ICMTS.1989.39313

M3 - Paper

SP - 225

EP - 226

T2 - 2nd International Conference on Microelectronic Test Structures, ICMTS 1989

Y2 - 13 March 1989 through 14 March 1989

ER -

A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

Abstract

Conference

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