A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

R. Mikkenie; O. Steigelmann; W.A. Groen; Johan E. ten Elshof

doi:10.1016/j.jeurceramsoc.2011.08.003

A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

R. Mikkenie, O. Steigelmann, W.A. Groen, Johan E. ten Elshof

Research output: Contribution to journal › Article › Academic › peer-review

6 Citations (Scopus)

Abstract

The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs

Original language	Undefined
Pages (from-to)	167-173
Number of pages	7
Journal	Journal of the European Ceramic Society
Volume	32
Issue number	1
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2011.08.003
Publication status	Published - 2012

Keywords

IR-84641
METIS-280147
Andere transportmiddelen

Access to Document

10.1016/j.jeurceramsoc.2011.08.003

Cite this

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title = "A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors",

abstract = "The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs",

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T1 - A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

AU - Mikkenie, R.

AU - Steigelmann, O.

AU - Groen, W.A.

AU - ten Elshof, Johan E.

PY - 2012

Y1 - 2012

N2 - The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs

AB - The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs

KW - IR-84641

KW - METIS-280147

KW - Andere transportmiddelen

U2 - 10.1016/j.jeurceramsoc.2011.08.003

DO - 10.1016/j.jeurceramsoc.2011.08.003

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JO - Journal of the European Ceramic Society

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