A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

R. Mikkenie, O. Steigelmann, W.A. Groen, Johan E. ten Elshof

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Abstract

The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs
Original languageUndefined
Pages (from-to)167-173
Number of pages7
JournalJournal of the European Ceramic Society
Volume32
Issue number1
DOIs
Publication statusPublished - 2012

Keywords

  • IR-84641
  • METIS-280147
  • Andere transportmiddelen

Cite this

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title = "A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors",
abstract = "The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol{\%} yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol{\%} were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs",
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author = "R. Mikkenie and O. Steigelmann and W.A. Groen and {ten Elshof}, {Johan E.}",
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volume = "32",
pages = "167--173",
journal = "Journal of the European Ceramic Society",
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A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors. / Mikkenie, R.; Steigelmann, O.; Groen, W.A.; ten Elshof, Johan E.

In: Journal of the European Ceramic Society, Vol. 32, No. 1, 2012, p. 167-173.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

AU - Mikkenie, R.

AU - Steigelmann, O.

AU - Groen, W.A.

AU - ten Elshof, Johan E.

PY - 2012

Y1 - 2012

N2 - The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs

AB - The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3 μm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5–2.0 mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6–3.0 mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs

KW - IR-84641

KW - METIS-280147

KW - Andere transportmiddelen

U2 - 10.1016/j.jeurceramsoc.2011.08.003

DO - 10.1016/j.jeurceramsoc.2011.08.003

M3 - Article

VL - 32

SP - 167

EP - 173

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

SN - 0955-2219

IS - 1

ER -