A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors

R. Mikkenie, O. Steigelmann, W.A. Groen, Johan E. ten Elshof

Research output: Contribution to journal › Article › Academic › peer-review

7 Citations (Scopus)
7 Downloads (Pure)

Fingerprint

Dive into the research topics of 'A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors'. Together they form a unique fingerprint.