A Robust 43 GHz VCO in Standard CMOS for OC-768 SONET Applications

A.P. van der Wel, Sander L.J. Gierkink, Robert C. Frye, Vito Bocuzzi, Bram Nauta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    29 Downloads (Pure)

    Abstract

    In this paper, we present a 43 GHz VCO in 0.13μm CMOS for use in SONET OC-768 optical networks. The design has a large tune range of 4.2%, which is sufficient to hold the design center frequency over anticipated process spread and temperature variation. A tuned output buffer is used to provide 1.3 Vp-p (single-ended) into a 90 fF capacitive load as is required when the VCO is used in typical clock and data recovery (CDR) circuits. Phase noise is -90 dBc/Hz at a 1 MHz offset from the carrier; this meets SONET jitter specifications. The VCO, including output buffers, consumes 14 mA from a 1 V supply and occupies 0.06 mm2 of die area.
    Original languageEnglish
    Title of host publicationESSCIRC 2004 - 29th European Solid-State Circuits Conference
    EditorsJ. Franca, R. Koch
    PublisherIEEE
    Pages345-348
    Number of pages4
    ISBN (Print)0780379950
    DOIs
    Publication statusPublished - Sep 2003
    Event29th European Solid-State Circuits Conference, ESSCIRC 2003 - Estoril, Portugal
    Duration: 16 Sep 200318 Sep 2003
    Conference number: 29

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference29th European Solid-State Circuits Conference, ESSCIRC 2003
    Abbreviated titleESSCIRC
    CountryPortugal
    CityEstoril
    Period16/09/0318/09/03

    Keywords

    • EWI-14439
    • IR-45669
    • METIS-212880

    Fingerprint Dive into the research topics of 'A Robust 43 GHz VCO in Standard CMOS for OC-768 SONET Applications'. Together they form a unique fingerprint.

  • Cite this

    van der Wel, A. P., Gierkink, S. L. J., Frye, R. C., Bocuzzi, V., & Nauta, B. (2003). A Robust 43 GHz VCO in Standard CMOS for OC-768 SONET Applications. In J. Franca, & R. Koch (Eds.), ESSCIRC 2004 - 29th European Solid-State Circuits Conference (pp. 345-348). IEEE. https://doi.org/10.1109/ESSCIRC.2003.1257143