A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses

Shaji Krishnan; Hans G. Kerkhoff

doi:10.1109/ETS.2011.31

A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses

Shaji Krishnan
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

6 Citations (Scopus)

8 Downloads (Pure)

Abstract

Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.

Original language	English
Title of host publication	Proceedings 16th IEEE European Test Symposium, ETS 2011
Place of Publication	USA
Publisher	IEEE
Pages	159-164
Number of pages	6
ISBN (Print)	978-1-4577-0483-3
DOIs	https://doi.org/10.1109/ETS.2011.31
Publication status	Published - 23 May 2011
Event	16th IEEE European Test Symposium, ETS 2011 - Trondheim, Norway Duration: 23 May 2011 → 27 May 2011 Conference number: 16

Publication series

Name
Publisher	IEEE Computer Society
ISSN (Print)	1530-1877

Conference

Conference	16th IEEE European Test Symposium, ETS 2011
Abbreviated title	ETS
Country/Territory	Norway
City	Trondheim
Period	23/05/11 → 27/05/11

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

METIS-284958
IR-79215
manufacturing test
EWI-21152
Metrics
CAES-TDT: Testable Design and Test
Outliers

Access to Document

10.1109/ETS.2011.31

Cite this

@inproceedings{7051d36f49c04283a7e4681b86262c3a,

title = "A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses",

abstract = "Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.",

keywords = "METIS-284958, IR-79215, manufacturing test, EWI-21152, Metrics, CAES-TDT: Testable Design and Test, Outliers",

author = "Shaji Krishnan and Kerkhoff, \{Hans G.\}",

note = "Best paper award ETS 2011 ISSN: 1530-1877; 16th IEEE European Test Symposium, ETS 2011, ETS ; Conference date: 23-05-2011 Through 27-05-2011",

year = "2011",

month = may,

day = "23",

doi = "10.1109/ETS.2011.31",

language = "English",

isbn = "978-1-4577-0483-3",

publisher = "IEEE",

pages = "159--164",

booktitle = "Proceedings 16th IEEE European Test Symposium, ETS 2011",

address = "United States",

}

TY - GEN

T1 - A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses

AU - Krishnan, Shaji

AU - Kerkhoff, Hans G.

N1 - Conference code: 16

PY - 2011/5/23

Y1 - 2011/5/23

N2 - Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.

AB - Mahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile product.

KW - METIS-284958

KW - IR-79215

KW - manufacturing test

KW - EWI-21152

KW - Metrics

KW - CAES-TDT: Testable Design and Test

KW - Outliers

U2 - 10.1109/ETS.2011.31

DO - 10.1109/ETS.2011.31

M3 - Conference contribution

SN - 978-1-4577-0483-3

SP - 159

EP - 164

BT - Proceedings 16th IEEE European Test Symposium, ETS 2011

PB - IEEE

CY - USA

T2 - 16th IEEE European Test Symposium, ETS 2011

Y2 - 23 May 2011 through 27 May 2011

ER -

A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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