Abstract
Atomic force scanning microscopy (AFM) was used to investigate the dispersion of low molecular weight compounds in ethylene-propylene copolymers (EPM). Where other microscopical techniques failed to provide morphological details of this type of blend, as a result of the restricted resolution (light microscopy) or the volatility of the low molecular weight component (SEM), the AFM technique provided surface images, which show inclusions in the matrix of the uncrosslinked polymers.
Original language | English |
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Pages (from-to) | 1773-1775 |
Number of pages | 3 |
Journal | Polymer |
Volume | 34 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1993 |
Keywords
- METIS-105275
- IR-9662