A semi-Analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence

K. V. Nikolaev*, V. Soltwisch, P. Honicke, F. Scholze, J. De La Rie, S. N. Yakunin, I. A. Makhotkin, R. W.E. Van De Kruijs, F. Bijkerk

*Corresponding author for this work

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