A Simple Method to Localize the Oxide Breakdown Regions and Hot Carriers Area Into VLSI Circuits

N.A. Akil, P. Le Minh, J. Holleman, V.E. Houtsma, P.H. Woerlee

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationDeuxieme Colloque Franco-Libanais sur la Science des Materiaux
    Place of PublicationBeyrouth, Liban
    Number of pages2
    Publication statusPublished - 25 May 2000


    • METIS-113896

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