Abstract
In this paper, an analytical model is established to describe the deposition kinetics and the deposition chamber characteristics that determine the deposition rates of PureB-layers grown by chemicalvapor deposition (CVD) from diborane (B2H6) as gas source on a non-rotating silicon wafer. The model takes into consideration the diffusion mechanism of the diborane species through the stationary boundary layer over the wafer, the gas phase processes and the related surface reactions. This model is based on a wide range of input parameters, such as initial diborane partial pressure, total gas flow, axial position on the wafer, deposition temperature, activation energy of PureB deposition from diborane, surface Hcoverage and reactor dimensions. The model's predictive capabilities have been verified by experiments performed at 700 C in these two different ASM CVD reactors.
Original language | English |
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Title of host publication | Thermal and Plasma CVD of Nanostructures and Their Applications |
Publisher | The Electrochemical Society Inc. |
Pages | 57-65 |
Number of pages | 9 |
Edition | 31 |
ISBN (Print) | 9781623320546 |
DOIs | |
Publication status | Published - 1 Jan 2013 |
Externally published | Yes |
Event | 221st ECS Meeting 2012: 221st ECS Meeting - Washington State Convention Center , Seattle, United States Duration: 6 May 2012 → 10 May 2012 https://www.electrochem.org/221 |
Publication series
Name | ECS Transactions |
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Number | 31 |
Volume | 45 |
ISSN (Print) | 1938-5862 |
ISSN (Electronic) | 1938-6737 |
Conference
Conference | 221st ECS Meeting 2012 |
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Country/Territory | United States |
City | Seattle |
Period | 6/05/12 → 10/05/12 |
Internet address |