A Single-Trim Frequency Reference Achieving ±120 ppm Accuracy from -50 °c to 170 °c

Alexander S. Delke*, Anne J. Annema, Mark S. Oude Alink, Yanyu Jin, Jos Verlinden, Bram Nauta

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

A single-trim, highly accurate Colpitts-based frequency reference is presented. Our analysis shows that the Colpitts-topology outperforms the cross-coupled LC-topology in terms of temperature stability. Measurements on prototypes in a 0.13- $\mu \text{m}$ high-voltage CMOS silicon on insulator (SOI) process were carried out from -50 °C to 170 °C. Based on sample-specific single room temperature trim and batch calibration, our frequency reference achieves an accuracy of ±120 ppm for 16 samples from a single wafer utilized for extracting the batch-calibration polynomial and ±300 ppm for 48 samples across three wafers from the same batch. This is a 4 $\times $ improvement over related single-trim state-of-the-art solutions. Frequency drift due to aging, tested after a six-day 175 °C storage, is below 100 ppm. The oscillator core dissipates 3.5 mW from a 2.5-V supply and has 220-ppm/V supply sensitivity without supply regulation.

Original languageEnglish
Pages (from-to)3434-3444
Number of pages11
JournalIEEE journal of solid-state circuits
Volume56
Issue number11
Early online date8 Jul 2021
DOIs
Publication statusPublished - 1 Nov 2021

Keywords

  • Batch calibration
  • Colpitts oscillator
  • Frequency reference
  • Single-trim
  • Temperature stability
  • Trimming

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