A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition

G.Y. Wang; Z. Houkes; Paulus P.L. Regtien; Maarten J. Korsten; G.R. Ji

A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition

G.Y. Wang, Z. Houkes, Paulus P.L. Regtien, Maarten J. Korsten, G.R. Ji

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell
Place of Publication	Brisbane, Queeensland, Australia
Pages	668-672
Number of pages	5
Publication status	Published - 16 Aug 1998

Keywords

METIS-113221

Cite this

Wang, G. Y., Houkes, Z., Regtien, P. P. L., Korsten, M. J., & Ji, G. R. (1998). A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. In Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell (pp. 668-672).

Wang, G.Y. ; Houkes, Z. ; Regtien, Paulus P.L. et al. / A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, 1998. pp. 668-672

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title = "A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition",

keywords = "METIS-113221",

author = "G.Y. Wang and Z. Houkes and Regtien, {Paulus P.L.} and Korsten, {Maarten J.} and G.R. Ji",

year = "1998",

month = aug,

day = "16",

language = "Undefined",

isbn = "0-8186-8512-3",

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Wang, GY, Houkes, Z, Regtien, PPL, Korsten, MJ & Ji, GR 1998, A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. in Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, pp. 668-672.

A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. / Wang, G.Y.; Houkes, Z.; Regtien, Paulus P.L. et al.
Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, 1998. p. 668-672.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Korsten, Maarten J.

AU - Ji, G.R.

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BT - Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell

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Wang GY, Houkes Z, Regtien PPL, Korsten MJ, Ji GR. A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. In Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia. 1998. p. 668-672