A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition

G.Y. Wang, Z. Houkes, Paulus P.L. Regtien, Maarten J. Korsten, G.R. Ji

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell
    Place of PublicationBrisbane, Queeensland, Australia
    Pages668-672
    Number of pages5
    Publication statusPublished - 16 Aug 1998

    Keywords

    • METIS-113221

    Cite this

    Wang, G. Y., Houkes, Z., Regtien, P. P. L., Korsten, M. J., & Ji, G. R. (1998). A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. In Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell (pp. 668-672). Brisbane, Queeensland, Australia.
    Wang, G.Y. ; Houkes, Z. ; Regtien, Paulus P.L. ; Korsten, Maarten J. ; Ji, G.R. / A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, 1998. pp. 668-672
    @inproceedings{aaf8782e4f904e94be91685d2f8b44f9,
    title = "A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition",
    keywords = "METIS-113221",
    author = "G.Y. Wang and Z. Houkes and Regtien, {Paulus P.L.} and Korsten, {Maarten J.} and G.R. Ji",
    year = "1998",
    month = "8",
    day = "16",
    language = "Undefined",
    isbn = "0-8186-8512-3",
    pages = "668--672",
    booktitle = "Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell",

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    Wang, GY, Houkes, Z, Regtien, PPL, Korsten, MJ & Ji, GR 1998, A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. in Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, pp. 668-672.

    A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. / Wang, G.Y.; Houkes, Z.; Regtien, Paulus P.L.; Korsten, Maarten J.; Ji, G.R.

    Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia, 1998. p. 668-672.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition

    AU - Wang, G.Y.

    AU - Houkes, Z.

    AU - Regtien, Paulus P.L.

    AU - Korsten, Maarten J.

    AU - Ji, G.R.

    PY - 1998/8/16

    Y1 - 1998/8/16

    KW - METIS-113221

    M3 - Conference contribution

    SN - 0-8186-8512-3

    SP - 668

    EP - 672

    BT - Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell

    CY - Brisbane, Queeensland, Australia

    ER -

    Wang GY, Houkes Z, Regtien PPL, Korsten MJ, Ji GR. A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition. In Proceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell. Brisbane, Queeensland, Australia. 1998. p. 668-672