A Statiscal Model to Describe Invariants Extracted from a 3-D Quadric Surface Patch and Its Applications in Region-Based Recognition

G.Y. Wang, Z. Houkes, Paulus P.L. Regtien, Maarten J. Korsten, G.R. Ji

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 14th International Conference on Pattern Recognition'98, Volume I, Editors Anil K.Jain, Svethe Venkatesh and Brian C.Lovell
    Place of PublicationBrisbane, Queeensland, Australia
    Number of pages5
    Publication statusPublished - 16 Aug 1998


    • METIS-113221

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