A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

G.Y. Wang, Z. Houkes, Paulus P.L. Regtien, Maarten J. Korsten, G.R. Ji

    Research output: Contribution to conferencePaper

    39 Downloads (Pure)

    Abstract

    A statistical model, describing noise-disturbed invariants extracted from a surface patch of a range image, has been developed and applied to region based pose estimation and classification of 3D quadrics. The Mahalanobis distance, which yields the same results as a Baysian classifier, is used for the classification of the surface patches. The results, compared with the Euclidean distance, appear to be much more reliable
    Original languageUndefined
    Pages668-672
    DOIs
    Publication statusPublished - 1998
    Event14th International Conference on Pattern Recognition, 1998 - Brisbane, Australia
    Duration: 16 Aug 199820 Aug 1998
    Conference number: 14

    Conference

    Conference14th International Conference on Pattern Recognition, 1998
    Abbreviated titleICPR 1998
    CountryAustralia
    CityBrisbane
    Period16/08/9820/08/98

    Keywords

    • IR-57718

    Cite this

    Wang, G. Y., Houkes, Z., Regtien, P. P. L., Korsten, M. J., & Ji, G. R. (1998). A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition. 668-672. Paper presented at 14th International Conference on Pattern Recognition, 1998, Brisbane, Australia. https://doi.org/10.1109/ICPR.1998.711232