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A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

  • G.Y. Wang
  • , Z. Houkes
  • , Paulus P.L. Regtien
  • , Maarten J. Korsten
  • , G.R. Ji

    Research output: Contribution to conferencePaper

    246 Downloads (Pure)

    Abstract

    A statistical model, describing noise-disturbed invariants extracted from a surface patch of a range image, has been developed and applied to region based pose estimation and classification of 3D quadrics. The Mahalanobis distance, which yields the same results as a Baysian classifier, is used for the classification of the surface patches. The results, compared with the Euclidean distance, appear to be much more reliable
    Original languageUndefined
    Pages668-672
    DOIs
    Publication statusPublished - 1998
    Event14th International Conference on Pattern Recognition, 1998 - Brisbane, Australia
    Duration: 16 Aug 199820 Aug 1998
    Conference number: 14

    Conference

    Conference14th International Conference on Pattern Recognition, 1998
    Abbreviated titleICPR 1998
    Country/TerritoryAustralia
    CityBrisbane
    Period16/08/9820/08/98

    Keywords

    • IR-57718

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