A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs

M.A. Khan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Abstract

The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.
Original languageUndefined
Title of host publication14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011
PublisherIEEE
Pages17-22
Number of pages6
ISBN (Print)978-1-4244-9753-9
DOIs
Publication statusPublished - 13 Apr 2011
Event14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011 - Cottbus, Germany
Duration: 13 Apr 201115 Apr 2011
Conference number: 14
http://www.ddecs.org/

Publication series

Name
PublisherIEEE
NumberCFP11DDE-P

Conference

Conference14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011
Abbreviated titleDDECS
CountryGermany
CityCottbus
Period13/04/1115/04/11
Internet address

Keywords

  • METIS-278746
  • IR-77926
  • Markov analysis
  • Analog and mixed-signal dependability
  • self-calibration
  • EWI-20401
  • redundancy
  • behavioral modeling
  • system-level platform
  • CAES-TDT: Testable Design and Test
  • self-diagnosis

Cite this

Khan, M. A., & Kerkhoff, H. G. (2011). A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 (pp. 17-22). IEEE. https://doi.org/10.1109/DDECS.2011.5783040
Khan, M.A. ; Kerkhoff, Hans G. / A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE, 2011. pp. 17-22
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title = "A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs",
abstract = "The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.",
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Khan, MA & Kerkhoff, HG 2011, A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE, pp. 17-22, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, 13/04/11. https://doi.org/10.1109/DDECS.2011.5783040

A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. / Khan, M.A.; Kerkhoff, Hans G.

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE, 2011. p. 17-22.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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N2 - The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.

AB - The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.

KW - METIS-278746

KW - IR-77926

KW - Markov analysis

KW - Analog and mixed-signal dependability

KW - self-calibration

KW - EWI-20401

KW - redundancy

KW - behavioral modeling

KW - system-level platform

KW - CAES-TDT: Testable Design and Test

KW - self-diagnosis

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BT - 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011

PB - IEEE

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Khan MA, Kerkhoff HG. A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE. 2011. p. 17-22 https://doi.org/10.1109/DDECS.2011.5783040