A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs

M.A. Khan, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    5 Citations (Scopus)

    Abstract

    The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.
    Original languageUndefined
    Title of host publication14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011
    PublisherIEEE
    Pages17-22
    Number of pages6
    ISBN (Print)978-1-4244-9753-9
    DOIs
    Publication statusPublished - 13 Apr 2011
    Event14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011 - Cottbus, Germany
    Duration: 13 Apr 201115 Apr 2011
    Conference number: 14
    http://www.ddecs.org/

    Publication series

    Name
    PublisherIEEE
    NumberCFP11DDE-P

    Conference

    Conference14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011
    Abbreviated titleDDECS
    CountryGermany
    CityCottbus
    Period13/04/1115/04/11
    Internet address

    Keywords

    • METIS-278746
    • IR-77926
    • Markov analysis
    • Analog and mixed-signal dependability
    • self-calibration
    • EWI-20401
    • redundancy
    • behavioral modeling
    • system-level platform
    • CAES-TDT: Testable Design and Test
    • self-diagnosis

    Cite this

    Khan, M. A., & Kerkhoff, H. G. (2011). A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 (pp. 17-22). IEEE. https://doi.org/10.1109/DDECS.2011.5783040