A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs

M.A. Khan; Hans G. Kerkhoff

doi:10.1109/DDECS.2011.5783040

A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs

M.A. Khan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

5 Downloads (Pure)

Abstract

The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.

Original language	Undefined
Title of host publication	14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011
Publisher	IEEE
Pages	17-22
Number of pages	6
ISBN (Print)	978-1-4244-9753-9
DOIs	https://doi.org/10.1109/DDECS.2011.5783040
Publication status	Published - 13 Apr 2011
Event	14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011 - Cottbus, Germany Duration: 13 Apr 2011 → 15 Apr 2011 Conference number: 14 http://www.ddecs.org/

Publication series

Name
Publisher	IEEE
Number	CFP11DDE-P

Conference

Conference	14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011
Abbreviated title	DDECS
Country/Territory	Germany
City	Cottbus
Period	13/04/11 → 15/04/11
Internet address	http://www.ddecs.org/

Keywords

METIS-278746
IR-77926
Markov analysis
Analog and mixed-signal dependability
self-calibration
EWI-20401
redundancy
behavioral modeling
system-level platform
CAES-TDT: Testable Design and Test
self-diagnosis

Access to Document

10.1109/DDECS.2011.5783040

http://eprints.eemcs.utwente.nl/secure2/20401/01/A_System-Level_Platform_for_Dependability_Enhancement_and_its_Analysis_for_Mixed-Signal_SoCs.pdf

Cite this

@inproceedings{b046406d185b4a69848a1532354019d2,

title = "A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs",

abstract = "The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.",

keywords = "METIS-278746, IR-77926, Markov analysis, Analog and mixed-signal dependability, self-calibration, EWI-20401, redundancy, behavioral modeling, system-level platform, CAES-TDT: Testable Design and Test, self-diagnosis",

author = "M.A. Khan and Kerkhoff, {Hans G.}",

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year = "2011",

month = apr,

day = "13",

doi = "10.1109/DDECS.2011.5783040",

language = "Undefined",

isbn = "978-1-4244-9753-9",

publisher = "IEEE",

number = "CFP11DDE-P",

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Khan, MA & Kerkhoff, HG 2011, A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE, pp. 17-22, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, 13/04/11. https://doi.org/10.1109/DDECS.2011.5783040

A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. / Khan, M.A.; Kerkhoff, Hans G.
14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011. IEEE, 2011. p. 17-22.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.

AB - The long-term functionality of any electronic system poses some requirements on the dependability of that system. Especially for critical systems it is becoming a crucial property with increasing system complexity and shrinking technology dimensions. Analog and mixed-signal systems are an important part of these critical systems. Until now little effort has been put into dependability of analog and mixed-signal systems, especially front/back-ends. This paper presents a new system-level platform for enhancing and analyzing the dependability of analog and mixed-signal front-ends in SoCs. Markov analysis has been used to theoretically investigate the dependability enhancement of these analog and mixed-signal front-ends based on this platform. Simulations in VHDL-AMS have also been conducted for an example target system consisting of a temperature sensor, operational amplifier and ADC to illustrate this platform. The gain parameter of the whole system, taken as an example of potential dependability hazard, has been investigated and enhanced based on this platform. The results show that this proposed platform is effective and has the potential to investigate and enhance dependability at system level.

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KW - Analog and mixed-signal dependability

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KW - EWI-20401

KW - redundancy

KW - behavioral modeling

KW - system-level platform

KW - CAES-TDT: Testable Design and Test

KW - self-diagnosis

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Y2 - 13 April 2011 through 15 April 2011

ER -