A Tool for Automatic Test Plan Generation for Analogue and Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationDish Hotel Enschede The Netherlands
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114750

    Cite this

    Engin, N., Kerkhoff, H. G., Tangelder, R. J. W. T., & Speek, H. (1997, Jun 11). A Tool for Automatic Test Plan Generation for Analogue and Mixed-Signal Circuits. Dish Hotel Enschede The Netherlands.