A Tool for Automatic Test Plan Generation for Analoque and Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings IEEE CSSP97
    Place of PublicationMierlo The Netherlands
    Pages177-184
    Number of pages8
    Publication statusPublished - 27 Nov 1997

    Keywords

    • METIS-112948

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