A Tool for Automatic Test Plan Generation for Analoque and Mixed-Signal Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{2752fb2ea02b49e0841eec448fc99c4e,

title = "A Tool for Automatic Test Plan Generation for Analoque and Mixed-Signal Circuits",

keywords = "METIS-112948",

author = "N. Engin and Kerkhoff, \{Hans G.\} and R.J.W.T. Tangelder and H. Speek",

year = "1997",

month = nov,

day = "27",

language = "Undefined",

isbn = "90-73461-12-X",

pages = "177--184",

booktitle = "Proceedings IEEE CSSP97",

}