A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the Designer Track of Design, Automation and Test in Europe Conference (DATE)
Place of Publication	Paris, France
Pages	115-122
Number of pages	8
Publication status	Published - 1 Feb 1998

Keywords

@inproceedings{7d2ffc9cc780494886d08175f857281d,

title = "A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits",

keywords = "METIS-112993",

author = "N. Engin and Kerkhoff, {Hans G.} and R.J.W.T. Tangelder and H. Speek",

year = "1998",

month = feb,

day = "1",

language = "Undefined",

pages = "115--122",

booktitle = "Proceedings of the Designer Track of Design, Automation and Test in Europe Conference (DATE)",

}

A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits. / Engin, N.; Kerkhoff, Hans G.; Tangelder, R.J.W.T. et al.
Proceedings of the Designer Track of Design, Automation and Test in Europe Conference (DATE). Paris, France, 1998. p. 115-122.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits

AU - Engin, N.

AU - Kerkhoff, Hans G.

AU - Tangelder, R.J.W.T.

AU - Speek, H.

PY - 1998/2/1

Y1 - 1998/2/1

KW - METIS-112993

M3 - Conference contribution

SP - 115

EP - 122

BT - Proceedings of the Designer Track of Design, Automation and Test in Europe Conference (DATE)

CY - Paris, France

ER -