A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Designer Track of Design, Automation and Test in Europe Conference (DATE)
    Place of PublicationParis, France
    Number of pages8
    Publication statusPublished - 1 Feb 1998


    • METIS-112993

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