Starting from the well-known idea of atomic shadowing during thin film growth (i.e. ballistic aggregation) a two-dimensional computer model is developed which includes surface relaxation by thermally induced surface diffusion and atomic attraction for a two-component system. An attempt was made to link the model interaction energies to real bonding energies in Co-Cr thin films. The model was applied to investigate structural as well as local configuration changes in the aggregates during systematic parameter variations.
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS