Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 3-10 |
| Journal | Key engineering materials |
| Volume | 611-612 |
| DOIs | |
| Publication status | Published - 2014 |
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Keywords
- METIS-303702
- IR-91150
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A yield criterion based on mean shear stress. / Emmens, W.C.; van den Boogaard, Antonius H.
In: Key engineering materials, Vol. 611-612, 2014, p. 3-10.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - A yield criterion based on mean shear stress
AU - Emmens, W.C.
AU - van den Boogaard, Antonius H.
PY - 2014
Y1 - 2014
N2 - This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.
AB - This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.
KW - METIS-303702
KW - IR-91150
U2 - 10.4028/www.scientific.net/KEM.611-612.3
DO - 10.4028/www.scientific.net/KEM.611-612.3
M3 - Article
VL - 611-612
SP - 3
EP - 10
JO - Key engineering materials
JF - Key engineering materials
SN - 1013-9826
ER -