A yield criterion based on mean shear stress

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.
Original languageEnglish
Pages (from-to)3-10
JournalKey engineering materials
Volume611-612
DOIs
Publication statusPublished - 2014

Fingerprint

Shear stress
Crystals
Direction compound
Plastics

Keywords

  • METIS-303702
  • IR-91150

Cite this

@article{7af94b2e6ac549b583ea26177ef977e7,
title = "A yield criterion based on mean shear stress",
abstract = "This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.",
keywords = "METIS-303702, IR-91150",
author = "W.C. Emmens and {van den Boogaard}, {Antonius H.}",
year = "2014",
doi = "10.4028/www.scientific.net/KEM.611-612.3",
language = "English",
volume = "611-612",
pages = "3--10",
journal = "Key engineering materials",
issn = "1013-9826",
publisher = "Trans Tech Publications Ltd",

}

A yield criterion based on mean shear stress. / Emmens, W.C.; van den Boogaard, Antonius H.

In: Key engineering materials, Vol. 611-612, 2014, p. 3-10.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - A yield criterion based on mean shear stress

AU - Emmens, W.C.

AU - van den Boogaard, Antonius H.

PY - 2014

Y1 - 2014

N2 - This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.

AB - This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.

KW - METIS-303702

KW - IR-91150

U2 - 10.4028/www.scientific.net/KEM.611-612.3

DO - 10.4028/www.scientific.net/KEM.611-612.3

M3 - Article

VL - 611-612

SP - 3

EP - 10

JO - Key engineering materials

JF - Key engineering materials

SN - 1013-9826

ER -