Abstract
This work investigates the relation between shear stress and plastic yield considering that a crystal can only deform in a limited set of directions. The shear stress in arbitrary directions is mapped for some cases showing relevant differences. Yield loci based on mean shear stress are con- structed. The Tresca yield criterion can be improved by averaging the shear stress over directions near the direction of maximum shear stress. Yield criteria based on averaging over crystallographic direction show a clear influence of the actual orientation of this direction, notably in case of few crystallographic directions. The general finding is that the higher the isotropy of a crystal, the lower the plane strain factor. The shape of the yield loci is comparable to those derived by the Hershey criterion with exponents lower than 3.
| Original language | English |
|---|---|
| Pages (from-to) | 3-10 |
| Journal | Key engineering materials |
| Volume | 611-612 |
| DOIs | |
| Publication status | Published - 2014 |
Keywords
- METIS-303702
- IR-91150
Fingerprint Dive into the research topics of 'A yield criterion based on mean shear stress'. Together they form a unique fingerprint.
Cite this
Emmens, W. C., & van den Boogaard, A. H. (2014). A yield criterion based on mean shear stress. Key engineering materials, 611-612, 3-10. https://doi.org/10.4028/www.scientific.net/KEM.611-612.3