A3TPG: Testgeneration for Embedded Macros

V. Kaal, Hans G. Kerkhoff, J.S. Hollema

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)
    Place of PublicationMierlo, the Netherlands
    Number of pages3
    Publication statusPublished - 1 Nov 1998


    • METIS-113055

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