A3TPG: Testgeneration for Embedded Macros

V. Kaal, Hans G. Kerkhoff, J.S. Hollema

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)
Place of Publication	Mierlo, the Netherlands
Pages	259-261
Number of pages	3
Publication status	Published - 1 Nov 1998

Keywords

@inproceedings{26a55db86e9d4f5194909911d4e694e6,

title = "A3TPG: Testgeneration for Embedded Macros",

keywords = "METIS-113055",

author = "V. Kaal and Kerkhoff, {Hans G.} and J.S. Hollema",

year = "1998",

month = nov,

day = "1",

language = "Undefined",

isbn = "90-73461-15-4",

pages = "259--261",

booktitle = "Proceedings of the IEEE Circuits, Systems and Signal Processing (CSSP'98)",

}