Abrasive Wear between Rough Surfaces in Deep Drawing

Marc Arthur Masen, Matthias B. de Rooij

Research output: Contribution to conferencePaperAcademic

36 Downloads (Pure)
Original languageUndefined
Number of pages1
Publication statusPublished - 2002
Event5th Engineering Mechanics Symposium, EM 2002 - Abdij Hotel Rolduc, Kerkrade, Netherlands
Duration: 18 Nov 200219 Nov 2002
Conference number: 5

Conference

Conference5th Engineering Mechanics Symposium, EM 2002
Abbreviated titleEM
CountryNetherlands
CityKerkrade
Period18/11/0219/11/02

Keywords

  • IR-60665

Cite this

Masen, M. A., & de Rooij, M. B. (2002). Abrasive Wear between Rough Surfaces in Deep Drawing. Paper presented at 5th Engineering Mechanics Symposium, EM 2002, Kerkrade, Netherlands.
Masen, Marc Arthur ; de Rooij, Matthias B. / Abrasive Wear between Rough Surfaces in Deep Drawing. Paper presented at 5th Engineering Mechanics Symposium, EM 2002, Kerkrade, Netherlands.1 p.
@conference{c8289fe9c887497ab1bd66ddef30ef80,
title = "Abrasive Wear between Rough Surfaces in Deep Drawing",
keywords = "IR-60665",
author = "Masen, {Marc Arthur} and {de Rooij}, {Matthias B.}",
year = "2002",
language = "Undefined",
note = "null ; Conference date: 18-11-2002 Through 19-11-2002",

}

Masen, MA & de Rooij, MB 2002, 'Abrasive Wear between Rough Surfaces in Deep Drawing' Paper presented at 5th Engineering Mechanics Symposium, EM 2002, Kerkrade, Netherlands, 18/11/02 - 19/11/02, .

Abrasive Wear between Rough Surfaces in Deep Drawing. / Masen, Marc Arthur; de Rooij, Matthias B.

2002. Paper presented at 5th Engineering Mechanics Symposium, EM 2002, Kerkrade, Netherlands.

Research output: Contribution to conferencePaperAcademic

TY - CONF

T1 - Abrasive Wear between Rough Surfaces in Deep Drawing

AU - Masen, Marc Arthur

AU - de Rooij, Matthias B.

PY - 2002

Y1 - 2002

KW - IR-60665

M3 - Paper

ER -

Masen MA, de Rooij MB. Abrasive Wear between Rough Surfaces in Deep Drawing. 2002. Paper presented at 5th Engineering Mechanics Symposium, EM 2002, Kerkrade, Netherlands.