AC loss and contact resistance of different CICC cable patterns: Experiments and numerical modeling

V.A. Anvar*, J. Qin, Y. Wu, T. Bagni, A. Devred, T. J. Haugan, M. S.A. Hossain, C. Zhou, A. Nijhuis

*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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Engineering & Materials Science

Chemistry