Accuracy assessment of extensional uncertainty modelled by random sets

X. Zhao, A. Stein, Tiejun Wang, X.L. Chen, L.Q. Tian

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageEnglish
Title of host publicationAdvances in Geo-Spatial Information Science
EditorsW. Shi, M.F. Goodchild, B. Lees, Y. Leung
Place of PublicationBoca Raton
PublisherCRC Press
Pages143-154
ISBN (Print)978-0-2031-2578-6
Publication statusPublished - 2012

Publication series

NameISPRS book series

Keywords

  • METIS-294578

Cite this

Zhao, X., Stein, A., Wang, T., Chen, X. L., & Tian, L. Q. (2012). Accuracy assessment of extensional uncertainty modelled by random sets. In W. Shi, M. F. Goodchild, B. Lees, & Y. Leung (Eds.), Advances in Geo-Spatial Information Science (pp. 143-154). (ISPRS book series). Boca Raton: CRC Press.