Accuracy assessment of extensional uncertainty modelled by random sets

X. Zhao, A. Stein, Tiejun Wang, X.L. Chen, L.Q. Tian

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageEnglish
Title of host publicationAdvances in Geo-Spatial Information Science
EditorsW. Shi, M.F. Goodchild, B. Lees, Y. Leung
Place of PublicationBoca Raton
PublisherCRC Press (Taylor & Francis)
ISBN (Print)978-0-2031-2578-6
Publication statusPublished - 2012

Publication series

NameISPRS book series


  • METIS-294578

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