Accurate test limits under nonnormal measurement error

Willem/Wim Albers, W.C.M. Kallenberg, G.D. Otten

    Research output: Contribution to journalArticleAcademicpeer-review

    4 Citations (Scopus)

    Abstract

    When screening a production process for nonconforming items the objective is to improve the average outgoing quality level. Due to measurement errors specification limits cannot be checked directly and hence test limits are required, which meet some given requirement, here given by a prescribed bound on the consumer loss. Classical test limits are based on normality, both for the product characteristic and for the measurement error. In practice, often nonnormality occurs for the product characteristic as well as for the measurement error. Recently, nonnormality of the product characteristic has been investigated. In this paper attention is focussed on the measurement error. Firstly, it is shown that nonnormality can lead to serious failure of the test limit. New test limits are therefore derived, which have the desired robustness property: a small loss under normality and a large gain in case of nonnormality when compared to the normal test limit. Monte Carlo results illustrate that the asymptotic theory is in agreement with moderate sample behaviour.
    Original languageEnglish
    Pages (from-to)1-33
    Number of pages33
    JournalMetrika
    Volume47
    Issue number1
    DOIs
    Publication statusPublished - 1998

    Keywords

    • inspection
    • consumer loss
    • EWI-13161
    • IR-62411
    • Specification limit
    • Density estimation
    • Second order unbiasedness
    • Edgeworth expansion
    • Monte Carlo experiments

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