Abstract
We propose an active multilayer mirror structure for EUV wavelengths
which can be adjusted to compensate for reflectance changes. The multilayer structure tunes the reflectance via an integrated piezoelectric layer that can change its dimension due to an externally applied voltage. Here, we present design and optimization of the mirror structure for maximum reflectance tuning. In addition, we present preliminary results showing that the deposition of piezoelectric thin films with the requisite layer smoothness and crystal structure are possible. Finally, polarization switching of the smoothest piezoelectric film is presented.
Original language | English |
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Article number | 494001 |
Pages (from-to) | 494001-1-494001-5 |
Number of pages | 5 |
Journal | Journal of physics D: applied physics |
Volume | 45 |
Issue number | 49 |
DOIs | |
Publication status | Published - 19 Nov 2012 |
Keywords
- METIS-287510
- IR-81151