Adaptive mastery testing using a multidimensional IRT model

Cees A.W. Glas, Hans J. Vos

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review


    Mastery testing concerns the decision to classify a student as a master or as a nonmaster. In the previous chapter, adaptive mastery testing (AMT) using item response theory (IRT) and sequential mastery testing (SMT) using Bayesian decision theory were combined into an approach labeled adaptive sequential mastery testing (ASMT). This approach is based on the one-parameter logistic model (1PLM; Rasch, 1960) and three-parameter logistic model (3PLM; Birnbaum, 1968). In the present chapter, ASMT is applied to a multidimensional IRT (MIRT) model.
    Original languageEnglish
    Title of host publicationElements of adaptive testing
    EditorsWim J. van der Linden, Cees A.W. Glas
    Place of PublicationNew York, NY
    ISBN (Electronic)978-0-387-85461-8
    ISBN (Print)978-0-387-85459-5
    Publication statusPublished - 2010


    • Loss function
    • Item parameter
    • Computerize adaptive testing (CAT)
    • Computer adaptive testing
    • Latent trait model


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