Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

D.J. van den Heuvel, Kees van der Werf, C.A.J. Putman, A. de Jongh, B.G. de Grooth, Carl Figdor, Jan Greve

    Research output: Contribution to conferencePoster

    159 Citations (Scopus)
    Original languageEnglish
    Publication statusPublished - 18 May 1994

    Cite this

    van den Heuvel, D. J., van der Werf, K., Putman, C. A. J., de Jongh, A., de Grooth, B. G., Figdor, C., & Greve, J. (1994). Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy.