Adhesion force measurements on hydrophobic and hydrophilic substrates with Atomic Force Microscopy

A. de Jongh, D.J. van den Heuvel, Kees van der Werf, B.G. de Grooth

    Research output: Contribution to conferencePosterOther research output

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 11 Oct 1995
    EventDiskussionstagung Raster-Sonden-Mikroskopien und organische Materialien IV, 1995 - Munich, Germany
    Duration: 11 Oct 199513 Oct 1995
    Conference number: 4

    Conference

    ConferenceDiskussionstagung Raster-Sonden-Mikroskopien und organische Materialien IV, 1995
    Country/TerritoryGermany
    CityMunich
    Period11/10/9513/10/95

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