Advanced crystal surface characterization with asymmetrical X-ray diffraction

Konstantin  Nikolaev; Sergey N. Yakunin; Igor Alexandrovich Makhotkin; Robbert Wilhelmus Elisabeth van de Kruijs; Frederik  Bijkerk

Advanced crystal surface characterization with asymmetrical X-ray diffraction

Konstantin Nikolaev, Sergey N. Yakunin (Contributor), Igor Alexandrovich Makhotkin (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Frederik Bijkerk (Contributor)

XUV Optics

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 17 Jan 2017
Event	Physics@Veldhoven 2017 - De Koningshof, Veldhoven, Netherlands Duration: 17 Jan 2017 → 18 Jan 2017

Conference

Conference	Physics@Veldhoven 2017
Country/Territory	Netherlands
City	Veldhoven
Period	17/01/17 → 18/01/17

Cite this

@conference{1ebd0232fe324aa8b70a6fff58ed6a0f,

title = "Advanced crystal surface characterization with asymmetrical X-ray diffraction",

author = "Konstantin Nikolaev and Yakunin, {Sergey N.} and Makhotkin, {Igor Alexandrovich} and {van de Kruijs}, {Robbert Wilhelmus Elisabeth} and Frederik Bijkerk",

year = "2017",

month = jan,

day = "17",

language = "English",

note = "Physics@Veldhoven 2017 ; Conference date: 17-01-2017 Through 18-01-2017",

}

TY - CONF

T1 - Advanced crystal surface characterization with asymmetrical X-ray diffraction

AU - Nikolaev, Konstantin

A2 - Yakunin, Sergey N.

A2 - Makhotkin, Igor Alexandrovich

A2 - van de Kruijs, Robbert Wilhelmus Elisabeth

A2 - Bijkerk, Frederik

PY - 2017/1/17

Y1 - 2017/1/17

M3 - Poster

T2 - Physics@Veldhoven 2017

Y2 - 17 January 2017 through 18 January 2017

ER -