Advanced crystal surface characterization with asymmetrical X-ray diffraction

Konstantin Nikolaev, Sergey N. Yakunin (Contributor), Igor Alexandrovich Makhotkin (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Frederik Bijkerk (Contributor)

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 17 Jan 2017
EventPhysics@Veldhoven 2017 - De Koningshof, Veldhoven, Netherlands
Duration: 17 Jan 201718 Jan 2017

Conference

ConferencePhysics@Veldhoven 2017
CountryNetherlands
CityVeldhoven
Period17/01/1718/01/17

Cite this

Nikolaev, K., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Advanced crystal surface characterization with asymmetrical X-ray diffraction. Poster session presented at Physics@Veldhoven 2017, Veldhoven, Netherlands.