Advanced device characterization and test methodologies

B. Ricco, H.C. de Graaff, F.M. Klaassen

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

    Original languageUndefined
    Title of host publicationIEEE, short course handbook, part I, International Electron Device Meeting
    Place of PublicationSan Fransisco
    Pages4-61
    Publication statusPublished - 1994

    Keywords

    • METIS-112535

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