Advanced device characterization and test methodologies

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

Original language	Undefined
Title of host publication	IEEE, short course handbook, part I, International Electron Device Meeting
Place of Publication	San Fransisco
Pages	4-61
Publication status	Published - 1994

Keywords

@inbook{1ee6a41edbba49508c2f7086190f71b1,

title = "Advanced device characterization and test methodologies",

keywords = "METIS-112535",

author = "B. Ricco and \{de Graaff\}, H.C. and F.M. Klaassen",

year = "1994",

language = "Undefined",

pages = "4--61",

booktitle = "IEEE, short course handbook, part I, International Electron Device Meeting",

}