Advanced metrology for multilayer mirrors

Research output: Contribution to conferencePoster

Original languageEnglish
Pages-
Publication statusPublished - 21 Jan 2014
EventPhysics@FOM Veldhoven 2014 - Veldhoven, Netherlands
Duration: 21 Jan 201422 Jan 2014

Conference

ConferencePhysics@FOM Veldhoven 2014
CountryNetherlands
CityVeldhoven
Period21/01/1422/01/14

Keywords

  • METIS-303791

Cite this

Makhotkin, I. A., van de Kruijs, R. W. E., Yakunin, S. N., Zoethout, E., Louis, E., Yakshin, A., & Bijkerk, F. (2014). Advanced metrology for multilayer mirrors. -. Poster session presented at Physics@FOM Veldhoven 2014, Veldhoven, Netherlands.