Advanced techniques for integrated circuit failure analysis

K.M.A. van Doorselaer

    Research output: ThesisPhD Thesis - Research UT, graduation external

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Verweij, J.F., Supervisor
    Award date29 Apr 1994
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9007123-7
    Publication statusPublished - 29 Apr 1994

    Keywords

    • METIS-111439

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