Advanced techniques for integrated circuit failure analysis

Research output: Thesis › PhD Thesis - Research UT, graduation external

Keywords

@phdthesis{38397616d1db4e5d9c9f51d7d081fd65,

title = "Advanced techniques for integrated circuit failure analysis",

keywords = "METIS-111439",

author = "\{van Doorselaer\}, K.M.A.",

year = "1994",

month = apr,

day = "29",

language = "Undefined",

isbn = "90-9007123-7",

publisher = "University of Twente",

address = "Netherlands",

type = "PhD Thesis - Research UT, graduation external",

school = "University of Twente",

}