Advances in monitoring oxide thin film growth in-situ atomic force microscopy

Joska Johannes Broekmaat, F.J.G. Roesthuis, B. Prinsens, Alexander Brinkman, Horst Rogalla

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 3 Nov 2006

    Keywords

    • METIS-236627

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