AFM and ellipsometry combined for nanoscale imaging

M. Memesa, A. Cumurcu, P.M. Schön, G.J. Vancso

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Publication statusPublished - 16 Nov 2010
EventDPI Annual Meeting 2010: Creating Value - Bergen op Zoom, Netherlands
Duration: 16 Nov 201017 Nov 2010

Conference

ConferenceDPI Annual Meeting 2010
CountryNetherlands
CityBergen op Zoom
Period16/11/1017/11/10

Keywords

  • METIS-272616

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