AFM and ellipsometry combined for nanoscale imaging

M. Memesa, A. Cumurcu, P.M. Schön, G.J. Vancso

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 16 Nov 2010
Event	DPI Annual Meeting 2010: Creating Value - Bergen op Zoom, Netherlands Duration: 16 Nov 2010 → 17 Nov 2010

Keywords

@conference{43ae23c70e6140238c0e37b0f684390d,

title = "AFM and ellipsometry combined for nanoscale imaging",

keywords = "METIS-272616",

author = "M. Memesa and A. Cumurcu and P.M. Sch{\"o}n and G.J. Vancso",

year = "2010",

month = nov,

day = "16",

language = "English",

note = "DPI Annual Meeting 2010 : Creating Value ; Conference date: 16-11-2010 Through 17-11-2010",

}