AFM and ellipsometry combined for nanoscale imaging

M. Memesa, A. Cumurcu, P.M. Schön, G.J. Vancso

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 14 Sep 2010
EventMESA+ Meeting 2010 - Enschede, Netherlands
Duration: 14 Sep 201014 Sep 2010

Conference

ConferenceMESA+ Meeting 2010
CountryNetherlands
CityEnschede
Period14/09/1014/09/10
Other(MESA+ Day/Dag)

Cite this

Memesa, M., Cumurcu, A., Schön, P. M., & Vancso, G. J. (2010). AFM and ellipsometry combined for nanoscale imaging. Poster session presented at MESA+ Meeting 2010, Enschede, Netherlands.