AHE Measurements of Nano-Sized dots and thin films

J.C. Lodder, Nobuaki Kikuchi, R. Murillo Vallejo, Leon Abelmann

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 31 May 2004
Event	7th Perpendiculair Magnetic Recording Conference, PMRC 2004 - Sendai, Japan Duration: 31 May 2004 → 2 Jun 2004 Conference number: 7

Conference	7th Perpendiculair Magnetic Recording Conference, PMRC 2004
Abbreviated title	PMRC
Country/Territory	Japan
City	Sendai
Period	31/05/04 → 2/06/04

AHE Measurements of Nano-Sized dots and thin films
Kikuchi, N., Murillo Vallejo, R., Abelmann, L. & Lodder, J. C., 31 May 2004, 7th Perpendiculair Magnetic Recording Conference, PMRC 2004. Sendai, Japan, p. 105-106 2 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Cite this

@conference{496b762bb7964151a69f2228470a4683,

title = "AHE Measurements of Nano-Sized dots and thin films",

author = "J.C. Lodder and Nobuaki Kikuchi and {Murillo Vallejo}, R. and Leon Abelmann",

year = "2004",

month = may,

day = "31",

language = "English",

note = "7th Perpendiculair Magnetic Recording Conference, PMRC 2004, PMRC ; Conference date: 31-05-2004 Through 02-06-2004",

}