AHE Measurements of Nano-Sized dots and thin films

J.C. Lodder, Nobuaki Kikuchi, R. Murillo Vallejo, Leon Abelmann

    Research output: Contribution to conferencePosterOther research output

    Original languageEnglish
    Pages-
    Publication statusPublished - 31 May 2004
    Event7th Perpendiculair Magnetic Recording Conference, PMRC 2004 - Sendai, Japan
    Duration: 31 May 20042 Jun 2004
    Conference number: 7

    Conference

    Conference7th Perpendiculair Magnetic Recording Conference, PMRC 2004
    Abbreviated titlePMRC
    CountryJapan
    CitySendai
    Period31/05/042/06/04

    Keywords

    • METIS-218468

    Cite this

    Lodder, J. C., Kikuchi, N., Murillo Vallejo, R., & Abelmann, L. (2004). AHE Measurements of Nano-Sized dots and thin films. -. Poster session presented at 7th Perpendiculair Magnetic Recording Conference, PMRC 2004, Sendai, Japan.
    Lodder, J.C. ; Kikuchi, Nobuaki ; Murillo Vallejo, R. ; Abelmann, Leon. / AHE Measurements of Nano-Sized dots and thin films. Poster session presented at 7th Perpendiculair Magnetic Recording Conference, PMRC 2004, Sendai, Japan.
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    title = "AHE Measurements of Nano-Sized dots and thin films",
    keywords = "METIS-218468",
    author = "J.C. Lodder and Nobuaki Kikuchi and {Murillo Vallejo}, R. and Leon Abelmann",
    year = "2004",
    month = "5",
    day = "31",
    language = "English",
    pages = "--",
    note = "7th Perpendiculair Magnetic Recording Conference, PMRC 2004, PMRC ; Conference date: 31-05-2004 Through 02-06-2004",

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    Lodder, JC, Kikuchi, N, Murillo Vallejo, R & Abelmann, L 2004, 'AHE Measurements of Nano-Sized dots and thin films' 7th Perpendiculair Magnetic Recording Conference, PMRC 2004, Sendai, Japan, 31/05/04 - 2/06/04, pp. -.

    AHE Measurements of Nano-Sized dots and thin films. / Lodder, J.C.; Kikuchi, Nobuaki; Murillo Vallejo, R.; Abelmann, Leon.

    2004. - Poster session presented at 7th Perpendiculair Magnetic Recording Conference, PMRC 2004, Sendai, Japan.

    Research output: Contribution to conferencePosterOther research output

    TY - CONF

    T1 - AHE Measurements of Nano-Sized dots and thin films

    AU - Lodder, J.C.

    AU - Kikuchi, Nobuaki

    AU - Murillo Vallejo, R.

    AU - Abelmann, Leon

    PY - 2004/5/31

    Y1 - 2004/5/31

    KW - METIS-218468

    M3 - Poster

    SP - -

    ER -

    Lodder JC, Kikuchi N, Murillo Vallejo R, Abelmann L. AHE Measurements of Nano-Sized dots and thin films. 2004. Poster session presented at 7th Perpendiculair Magnetic Recording Conference, PMRC 2004, Sendai, Japan.