AHE Measurements of Nano-Sized dots and thin films

J.C. Lodder, Nobuaki Kikuchi, R. Murillo Vallejo, Leon Abelmann

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    • 2004

      AHE Measurements of Nano-Sized dots and thin films

      Kikuchi, N., Murillo Vallejo, R., Abelmann, L. & Lodder, J. C., 31 May 2004, 7th Perpendiculair Magnetic Recording Conference, PMRC 2004. Sendai, Japan, p. 105-106 2 p.

      Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review