AHE Measurements of Nano-Sized dots and thin films

Nobuaki Kikuchi, R. Murillo Vallejo, L. Abelmann, J.C. Lodder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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2004

AHE Measurements of Nano-Sized dots and thin films
Lodder, J. C., Kikuchi, N., Murillo Vallejo, R. & Abelmann, L., 31 May 2004.
Research output: Contribution to conference › Poster › Other research output