AHE measurements of very thin films and nanosized dots

Nobuaki Kikuchi, R. Murillo Vallejo, J.C. Lodder

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    8 Citations (Scopus)

    Abstract

    In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot arrayis prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensityof the jumps is smaller than the expected value from a total magnetization reversal of one dot.
    Original languageUndefined
    Pages (from-to)320-324
    Number of pages5
    JournalJournal of magnetism and magnetic materials
    Volume287
    DOIs
    Publication statusPublished - 2005

    Keywords

    • TST-LIL: Laser Interference Lithography
    • SMI-TST: From 2006 in EWI-TST
    • METIS-226370
    • IR-62974
    • EWI-5479
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • TSTNE-Magnet-AHE: Anomalous Hall Effect

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