In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot arrayis prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensityof the jumps is smaller than the expected value from a total magnetization reversal of one dot.
- TST-LIL: Laser Interference Lithography
- SMI-TST: From 2006 in EWI-TST
- SMI-EXP: EXPERIMENTAL TECHNIQUES
- TSTNE-Magnet-AHE: Anomalous Hall Effect
Kikuchi, N., Murillo Vallejo, R., & Lodder, J. C. (2005). AHE measurements of very thin films and nanosized dots. Journal of magnetism and magnetic materials, 287, 320-324. https://doi.org/10.1016/j.jmmm.2004.10.052