Algorithms for ADC multi-site test with digital input stimulus

Xiaoqin Sheng; Hans G. Kerkhoff; Amir Zjajo; Guido Gronthoud

doi:10.1109/ETS.2009.17

Algorithms for ADC multi-site test with digital input stimulus

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

217 Downloads (Pure)

Abstract

This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specificationbased tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.

Original language	Undefined
Title of host publication	Proceedings of the 2009 14th European Test Symposium
Place of Publication	Washington, DC, USA
Publisher	IEEE
Pages	45-50
Number of pages	6
ISBN (Print)	978-0-7695-3703-0
DOIs	https://doi.org/10.1109/ETS.2009.17
Publication status	Published - 25 May 2009
Event	14th IEEE European Test Symposium, ETS 2009 - Sevilla, Spain Duration: 25 May 2009 → 29 May 2009 Conference number: 14

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	14th IEEE European Test Symposium, ETS 2009
Abbreviated title	ETS
Country/Territory	Spain
City	Sevilla
Period	25/05/09 → 29/05/09

Keywords

METIS-264520
EWI-17369
IR-69800

Access to Document

10.1109/ETS.2009.17

Cite this

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title = "Algorithms for ADC multi-site test with digital input stimulus",

abstract = "This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specificationbased tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.",

keywords = "METIS-264520, EWI-17369, IR-69800",

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AU - Kerkhoff, Hans G.

AU - Zjajo, Amir

AU - Gronthoud, Guido

N1 - Conference code: 14

PY - 2009/5/25

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N2 - This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specificationbased tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.

AB - This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specificationbased tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.

KW - METIS-264520

KW - EWI-17369

KW - IR-69800

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