Algorithms for ADC multi-site test with digital input stimulus

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    65 Downloads (Pure)

    Abstract

    This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specificationbased tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.
    Original languageUndefined
    Title of host publicationProceedings of the 2009 14th European Test Symposium
    Place of PublicationWashington, DC, USA
    PublisherIEEE Computer Society
    Pages45-50
    Number of pages6
    ISBN (Print)978-0-7695-3703-0
    DOIs
    Publication statusPublished - 25 May 2009
    Event14th IEEE European Test Symposium, ETS 2009 - Sevilla, Spain
    Duration: 25 May 200929 May 2009
    Conference number: 14

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    Conference14th IEEE European Test Symposium, ETS 2009
    Abbreviated titleETS
    CountrySpain
    CitySevilla
    Period25/05/0929/05/09

    Keywords

    • METIS-264520
    • EWI-17369
    • IR-69800

    Cite this

    Sheng, X., Kerkhoff, H. G., Zjajo, A., & Gronthoud, G. (2009). Algorithms for ADC multi-site test with digital input stimulus. In Proceedings of the 2009 14th European Test Symposium (pp. 45-50). [10.1109/ETS.2009.17] Washington, DC, USA: IEEE Computer Society. https://doi.org/10.1109/ETS.2009.17