### Abstract

This paper addresses the problem of aligning the images of
feet taken at different instances in time. We propose to use
SIFT keypoints to find the geometric deformation between two
photo’s. We then have a set of landmarks for each image.
By finding the corresponding landmarks (i.e. matching the keypoints), we know the deformation in a sparse set of points.
Using these points, we calculate a B-spline deformation
model, which allows us to describe the deformation in every
point in the image.
The algorithm that we have developed matches the keypoints,
and updates the deformation model iteratively from coarse to
fine. This significantly increases the performance in terms of
speed and robustness.
In order to obtain enough reliable keypoints, we propose a
debayering algorithm to realize a relatively high resolution in
the green channel. In addition we apply processing to the image
to enhance its local contrast.

Original language | Undefined |
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Title of host publication | Proceedings of SPS-DARTS 2007 the third annual IEEE Benelux/DSP Valley Signal Processing Symposium |

Editors | W. Philips |

Place of Publication | Belgium |

Publisher | IEEE Benelux/DSP |

Pages | 185-193 |

Number of pages | 8 |

ISBN (Print) | not assigned |

Publication status | Published - 21 Mar 2007 |

Event | 3rd Annual IEEE Benelux/DSP Valley Signal Processing Symposium, SPS-DARTS 2007 - Antwerp, Belgium Duration: 21 Mar 2007 → 22 Mar 2007 Conference number: 3 |

### Publication series

Name | |
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Publisher | IEEE Benelux/DSP |

### Conference

Conference | 3rd Annual IEEE Benelux/DSP Valley Signal Processing Symposium, SPS-DARTS 2007 |
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Abbreviated title | SPS-DARTS |

Country | Belgium |

City | Antwerp |

Period | 21/03/07 → 22/03/07 |

### Keywords

- METIS-245702
- EWI-9312
- IR-63947

## Cite this

Klein, A., van der Heijden, F., Slump, C. H., & Uyl, M. J. (2007). Alignment of diabetic feet images. In W. Philips (Ed.),

*Proceedings of SPS-DARTS 2007 the third annual IEEE Benelux/DSP Valley Signal Processing Symposium*(pp. 185-193). Belgium: IEEE Benelux/DSP.