Alloying of Pd thin films with Nb(001)

E. Hüger; Herbert Wormeester; K. Osuch

doi:10.1016/j.elspec.2005.03.003

Alloying of Pd thin films with Nb(001)

E. Hüger, Herbert Wormeester, K. Osuch

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Abstract

Annealing at elevated temperatures (1000–1600 K) of at least 10 ML thick Pd films deposited on Nb(0 0 1) has been found to result in a substrate capped by a pseudomorphic monolayer of Pd. This 1 ML thick Pd cap layer was characterised with a combination of UPS and DFT-calculations. UPS, RHEED and AES show that this cap layer protects the Nb(0 0 1) surface against (oxygen) contamination, which is a well known problem of Nb substrates. AES sputter profiling indicates that a major part of the Pd material in excess of the pseudomorphic monolayer is dissolved in the Nb lattice just below the surface. XPD shows that these dissolved Pd atoms occupy substitutional sites in the substrate. The analysis of the XPS-anisotropy also provides some information about the concentration and positions of the Pd and Nb atoms in the alloyed samples.

Original language	Undefined
Pages (from-to)	79-89
Number of pages	11
Journal	Journal of electron spectroscopy and related phenomena
Volume	148
Issue number	2
DOIs	https://doi.org/10.1016/j.elspec.2005.03.003
Publication status	Published - 2005

Keywords

IR-77397
Niobium
Electron diffraction
METIS-227120
Photoelectron spectroscopy (PES)
Surface composition
Palladium

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10.1016/j.elspec.2005.03.003

Cite this

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title = "Alloying of Pd thin films with Nb(001)",

abstract = "Annealing at elevated temperatures (1000–1600 K) of at least 10 ML thick Pd films deposited on Nb(0 0 1) has been found to result in a substrate capped by a pseudomorphic monolayer of Pd. This 1 ML thick Pd cap layer was characterised with a combination of UPS and DFT-calculations. UPS, RHEED and AES show that this cap layer protects the Nb(0 0 1) surface against (oxygen) contamination, which is a well known problem of Nb substrates. AES sputter profiling indicates that a major part of the Pd material in excess of the pseudomorphic monolayer is dissolved in the Nb lattice just below the surface. XPD shows that these dissolved Pd atoms occupy substitutional sites in the substrate. The analysis of the XPS-anisotropy also provides some information about the concentration and positions of the Pd and Nb atoms in the alloyed samples.",

keywords = "IR-77397, Niobium, Electron diffraction, METIS-227120, Photoelectron spectroscopy (PES), Surface composition, Palladium",

author = "E. H{\"u}ger and Herbert Wormeester and K. Osuch",

year = "2005",

doi = "10.1016/j.elspec.2005.03.003",

language = "Undefined",

volume = "148",

pages = "79--89",

journal = "Journal of electron spectroscopy and related phenomena",

issn = "0368-2048",

publisher = "Elsevier B.V.",

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}

TY - JOUR

T1 - Alloying of Pd thin films with Nb(001)

AU - Hüger, E.

AU - Wormeester, Herbert

AU - Osuch, K.

PY - 2005

Y1 - 2005

N2 - Annealing at elevated temperatures (1000–1600 K) of at least 10 ML thick Pd films deposited on Nb(0 0 1) has been found to result in a substrate capped by a pseudomorphic monolayer of Pd. This 1 ML thick Pd cap layer was characterised with a combination of UPS and DFT-calculations. UPS, RHEED and AES show that this cap layer protects the Nb(0 0 1) surface against (oxygen) contamination, which is a well known problem of Nb substrates. AES sputter profiling indicates that a major part of the Pd material in excess of the pseudomorphic monolayer is dissolved in the Nb lattice just below the surface. XPD shows that these dissolved Pd atoms occupy substitutional sites in the substrate. The analysis of the XPS-anisotropy also provides some information about the concentration and positions of the Pd and Nb atoms in the alloyed samples.

AB - Annealing at elevated temperatures (1000–1600 K) of at least 10 ML thick Pd films deposited on Nb(0 0 1) has been found to result in a substrate capped by a pseudomorphic monolayer of Pd. This 1 ML thick Pd cap layer was characterised with a combination of UPS and DFT-calculations. UPS, RHEED and AES show that this cap layer protects the Nb(0 0 1) surface against (oxygen) contamination, which is a well known problem of Nb substrates. AES sputter profiling indicates that a major part of the Pd material in excess of the pseudomorphic monolayer is dissolved in the Nb lattice just below the surface. XPD shows that these dissolved Pd atoms occupy substitutional sites in the substrate. The analysis of the XPS-anisotropy also provides some information about the concentration and positions of the Pd and Nb atoms in the alloyed samples.

KW - IR-77397

KW - Niobium

KW - Electron diffraction

KW - METIS-227120

KW - Photoelectron spectroscopy (PES)

KW - Surface composition

KW - Palladium

U2 - 10.1016/j.elspec.2005.03.003

DO - 10.1016/j.elspec.2005.03.003

M3 - Article

SN - 0368-2048

VL - 148

SP - 79

EP - 89

JO - Journal of electron spectroscopy and related phenomena

JF - Journal of electron spectroscopy and related phenomena

IS - 2

ER -