Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

A. Lucieer, M.J. Kraak

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publication Proceedings of the conference on visualization and data analysis 2004, EI10
Subtitle of host publicationpart of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California
EditorsRobert F. Erbacher, Philip C. Chen, Jonathan C. Roberts, Matti T. Gröhn, Katy Börner
Place of PublicationSan Jose, USA
PublisherSPIE
Pages201-211
Number of pages6
Publication statusPublished - 2004
EventConference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004 - San Jose, United States
Duration: 18 Jan 200422 Jan 2004

Conference

ConferenceConference on visualization and data analysis 2004, EI10
CountryUnited States
CitySan Jose
Period18/01/0422/01/04

Keywords

  • ADLIB-ART-1149
  • GIP

Cite this

Lucieer, A., & Kraak, M. J. (2004). Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. In R. F. Erbacher, P. C. Chen, J. C. Roberts, M. T. Gröhn, & K. Börner (Eds.), Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California (pp. 201-211). San Jose, USA: SPIE.
Lucieer, A. ; Kraak, M.J. / Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. editor / Robert F. Erbacher ; Philip C. Chen ; Jonathan C. Roberts ; Matti T. Gröhn ; Katy Börner. San Jose, USA : SPIE, 2004. pp. 201-211
@inproceedings{449988e86ba2474a89413f4dfae90318,
title = "Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery",
keywords = "ADLIB-ART-1149, GIP",
author = "A. Lucieer and M.J. Kraak",
year = "2004",
language = "English",
pages = "201--211",
editor = "Erbacher, {Robert F.} and Chen, {Philip C.} and Roberts, {Jonathan C.} and Gr{\"o}hn, {Matti T.} and Katy B{\"o}rner",
booktitle = "Proceedings of the conference on visualization and data analysis 2004, EI10",
publisher = "SPIE",
address = "United States",

}

Lucieer, A & Kraak, MJ 2004, Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. in RF Erbacher, PC Chen, JC Roberts, MT Gröhn & K Börner (eds), Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. SPIE, San Jose, USA, pp. 201-211, Conference on visualization and data analysis 2004, EI10, San Jose, United States, 18/01/04.

Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. / Lucieer, A.; Kraak, M.J.

Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. ed. / Robert F. Erbacher; Philip C. Chen; Jonathan C. Roberts; Matti T. Gröhn; Katy Börner. San Jose, USA : SPIE, 2004. p. 201-211.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

AU - Lucieer, A.

AU - Kraak, M.J.

PY - 2004

Y1 - 2004

KW - ADLIB-ART-1149

KW - GIP

UR - https://ezproxy2.utwente.nl/login?url=https://webapps.itc.utwente.nl/library/2004/peer_conf/lucieer.pdf

M3 - Conference contribution

SP - 201

EP - 211

BT - Proceedings of the conference on visualization and data analysis 2004, EI10

A2 - Erbacher, Robert F.

A2 - Chen, Philip C.

A2 - Roberts, Jonathan C.

A2 - Gröhn, Matti T.

A2 - Börner, Katy

PB - SPIE

CY - San Jose, USA

ER -

Lucieer A, Kraak MJ. Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. In Erbacher RF, Chen PC, Roberts JC, Gröhn MT, Börner K, editors, Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California. San Jose, USA: SPIE. 2004. p. 201-211