Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery

A. Lucieer, M.J. Kraak

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publication Proceedings of the conference on visualization and data analysis 2004, EI10
Subtitle of host publicationpart of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California
EditorsRobert F. Erbacher, Philip C. Chen, Jonathan C. Roberts, Matti T. Gröhn, Katy Börner
Place of PublicationSan Jose, USA
PublisherSPIE
Pages201-211
Number of pages6
Publication statusPublished - 2004
EventConference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004 - San Jose, United States
Duration: 18 Jan 200422 Jan 2004

Conference

ConferenceConference on visualization and data analysis 2004, EI10
CountryUnited States
CitySan Jose
Period18/01/0422/01/04

Keywords

  • ADLIB-ART-1149
  • GIP

Cite this

Lucieer, A., & Kraak, M. J. (2004). Alpha - shapes for visualizing irregular shaped class clusters in 3D feature space for classification of remotely sensed imagery. In R. F. Erbacher, P. C. Chen, J. C. Roberts, M. T. Gröhn, & K. Börner (Eds.), Proceedings of the conference on visualization and data analysis 2004, EI10: part of IS&T SPIE international sympoium on Electronic Imaging 2004, 18-22 January 2004, San Jose, California (pp. 201-211). San Jose, USA: SPIE.